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Ce YAP Scintillator Crystals Mechanically Chemical Resistant For Electron Microscopy

Basic Information
Place of Origin: China
Brand Name: CRYLINK
Certification: Iso9001
Model Number: CRYLINK-Ce YAP Scintillator Crystal
Minimum Order Quantity: 1 Pieces
Price: negotiation
Packaging Details: Carton
Delivery Time: 3-4 weeks
Payment Terms: TT
Supply Ability: 100 pieces /month
Detail Information
Name: Ce YAP Scintillation Detector Chemical Composition: YAlO3
Melting (℃): 1875℃ Crystal Structure: Rhombic
Structure: Pnma Cell Parameters(): (a)5.329 (b)7.371 (c)5.180
High Light:

cerium doped yttrium aluminum garnet

,

bgo bismuth germanate


Product Description

Description

Yttrium aluminum perovskite activated by cerium is a fast(28 ns decay time), mechanically and chemically resistant scintillation material. These scintillators have very low energy secondary X-ray emission, which is of advantage in imaging applications. YAP:Ce detectors are used for gamma and X-ray counting, electron microscopy, electron and X-ray imaging screens. The materials scintillation and mechanical properties enable their use in tomography systems.

 

Features

  • Fine physical and chemical characteristics

  • Suitable for ultra-thin screen applications

  • Suitable for tomography systems

  • Fast decay time: 28 ns

  • High light output

Applications

  • CT

  • PET

  • Particle accelerator

  • SPECT

Physical and Chemical Properties

Property

Ce:YAP

Chemical composition

YAlO3

Melting (℃)

1875℃

Crystal structure

Rhombic

Structure

Pnma

Cell parameters()

(a)5.329
(b)7.371
(c)5.180

Hardness

8.6

Density(g/cm3)

5.37

Thermal conductivity(W/℃cm,25℃)

0.11

expanding coefficient(10-6/℃)

(a)4.2
(b)11.7
(c)5.1

Refractive index(=1.079m)

(na)1.931
(nb)1.923
(nc)1.909

 

 

Scintillation properties:

 

Emission peak (nm)

360

Light yield (PhotonsMev-1)

25000

Relative light output (%NaI:Tl)

40

Decay time (ns)

25-38

Energy resolution

<5%

Zeff

40

Afterglow (% after 6ms)

<0.005

 

Polishing Specification for Laser Grade

Orientation Tolerence

<0.5°

Thickness/Diameter Tolerance

±0.05 mm

Parallel

10’’

Perpendicular

5’

surface Quality

10/5

Clear Aperture

>90%

Chamfer

<0.2×45°

Maximum dimensions

Dia55mm

Standard product

Dimensions, mm

Decay time, ns

Light yeild, photons/Mev

Refractive Index

5×5×0.5

< 40

25000

1.91 - 1.93

5×5×1

10×5×0.5

10×5×1

10×10×0.5

10×10×1

25×25×0.5

25×25×1

dia5×0.5

dia5×1

dia10×0.5

dia10×1

 
 

Contact Details
june

Phone Number : +8618699681379