Name: | Ce YAP Scintillation Detector | Chemical Composition: | YAlO3 |
---|---|---|---|
Melting (℃): | 1875℃ | Crystal Structure: | Rhombic |
Structure: | Pnma | Cell Parameters(): | (a)5.329 (b)7.371 (c)5.180 |
High Light: | cerium doped yttrium aluminum garnet,bgo bismuth germanate |
Yttrium aluminum perovskite activated by cerium is a fast(28 ns decay time), mechanically and chemically resistant scintillation material. These scintillators have very low energy secondary X-ray emission, which is of advantage in imaging applications. YAP:Ce detectors are used for gamma and X-ray counting, electron microscopy, electron and X-ray imaging screens. The materials scintillation and mechanical properties enable their use in tomography systems.
Features
Fine physical and chemical characteristics
Suitable for ultra-thin screen applications
Suitable for tomography systems
Fast decay time: 28 ns
High light output
Applications
CT
PET
Particle accelerator
SPECT
Physical and Chemical Properties
Property |
Ce:YAP |
Chemical composition |
YAlO3 |
Melting (℃) |
1875℃ |
Crystal structure |
Rhombic |
Structure |
Pnma |
Cell parameters() |
(a)5.329 |
Hardness |
8.6 |
Density(g/cm3) |
5.37 |
Thermal conductivity(W/℃cm,25℃) |
0.11 |
expanding coefficient(10-6/℃) |
(a)4.2 |
Refractive index(=1.079m) |
(na)1.931 |
Scintillation properties:
Emission peak (nm) |
360 |
Light yield (PhotonsMev-1) |
25000 |
Relative light output (%NaI:Tl) |
40 |
Decay time (ns) |
25-38 |
Energy resolution |
<5% |
Zeff |
40 |
Afterglow (% after 6ms) |
<0.005 |
Polishing Specification for Laser Grade |
|
Orientation Tolerence |
<0.5° |
Thickness/Diameter Tolerance |
±0.05 mm |
Parallel |
10’’ |
Perpendicular |
5’ |
surface Quality |
10/5 |
Clear Aperture |
>90% |
Chamfer |
<0.2×45° |
Maximum dimensions |
Dia55mm |
Standard product
Dimensions, mm |
Decay time, ns |
Light yeild, photons/Mev |
Refractive Index |
5×5×0.5 |
< 40 |
25000 |
1.91 - 1.93 |
5×5×1 |
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10×5×0.5 |
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10×5×1 |
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10×10×0.5 |
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10×10×1 |
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25×25×0.5 |
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25×25×1 |
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dia5×0.5 |
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dia5×1 |
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dia10×0.5 |
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dia10×1 |